Interactive modeling of semiconductor yield and defect level using Seth-Agrawal model
Seth-Agrawal model for defect level by: V. D. Agrawal et al., "Fault coverage requirement in production testing of LSI circuits" in IEEE JSSC, vol. 17, no. 1, pp. 57-61, Feb. 1982.
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Poisson Yield: Y = e-(A×D)   |  Usage: Use the controls on the left to see real-time updates. Click "Refresh All Plots" or "Update Plot Ranges" to regenerate all graphs with new axis ranges. Click the tabs to navigate between plots.